Method and system for performing alignment of a projection image to detected infrared (IR) radiation information

ABSTRACT

A method of presenting a visible representation of infrared (IR) radiation information onto an observed real world scene based on IR radiation emitted from said observed real world scene, using a thermography arrangement comprising an IR imaging system, a visible light imaging system, and a visible light projecting system.

CROSS-REFERENCE TO RELATED APPLICATIONS

This patent application is a continuation of International Patent Application No. PCT/EP2013/054077 filed Feb. 28, 2013, which claims the benefit of European Patent Application No. 12157533.6 filed Feb. 29, 2012, all of which are hereby incorporated by reference in their entirety.

TECHNICAL FIELD

One or more embodiments of the present invention generally relate to the projection of an image onto an observed scene dependent on detected infrared (IR) radiation information from the object scene. More specifically, one or more embodiments of the present invention relate to alignment of a projection image to detected infrared (IR) radiation information.

BACKGROUND

Within the field of infrared (IR), or thermal, imaging, it is common to capture IR radiation emitted from an observed scene with an IR imaging system, also referred to as a thermography arrangement, e.g. in the form of an IR camera, and to process the IR radiation information into a visible light image that is typically shown to a user on a display of the system.

A problem with this is that it is difficult for a user of the imaging system to discern and analyze what is being shown on the display, since the image representing the IR radiation information often has a low resolution and the display unit typically is quite small.

The user of the IR imaging system may choose to save one or more images and transfer them to another unit, such as a computer, for later display. In this way, the one or more images may be presented on a larger display. However, this leads to a delay from the moment when the IR radiation is detected to the moment when the detected information is presented to the user, in other words, the analysis of the detected information may not be performed on site. Furthermore, it may be hard for the user to retrospectively relate the information displayed on a computer display to the real world scene where the IR radiation detection has been performed.

In a typical use case of an IR camera an operator would like to analyze the characteristics of one or more objects or surfaces in an observed scene by detecting the temperature of different points or parts of the object. The operator captures an IR image and then compares the IR image of the scene with the real world scene. In this process the operator has to translate or interpret the image information to the reality by comparing what is displayed on a typically small display of the IR camera with the real world scene, in order to understand how the image information on the display relates to the real world scene, with the entailing effort, error source and delay there may be.

Some pieces of related art address these problems by providing a combination of an IR detector or IR camera and a visible light projector that enables display of a larger visible image on site, the visible image being projected for instance onto a flat surface of the observed scene. This related art is devised to generate a visible light image dependent on the IR radiation and to project a visible interpretation of the IR radiation directly onto the observed scene. Thereby it is made possible to use the IR radiation information in a more close connection to the observed scene.

The production of projection devices of small sizes is becoming increasingly common as the technology advances and smaller construction components are available. Such “miniature” projectors may therefore for example be used in combination with handheld devices, such as mobile communication devices with imaging capabilities or imaging systems. This development makes it more feasible also to produce handheld IR cameras with a projector. However, in related art there remains to develop the methods for integrating an IR camera with a projector.

Since the capturing of IR information in the form of an IR image and the projection of a visual image that is a visual representation of the IR image are performed by different and physically separated components, the optical axes of the components are typically at a distance from each other and an optical phenomenon known as parallax will arise. To compensate for the parallax error, the images must be aligned. Traditionally alignment is achieved by adaptation of optical elements in the imaging system, for instance focus lenses or beam splitters. Alignment using optical or other physical elements in the imaging system requires space in the imaging systems and may be hard to fit. Furthermore, the inclusion of additional or specially adapted elements in the imaging system renders a higher production cost.

Thus, there exists a need for improved alignment of a visual representation of IR radiation information to detected IR information.

SUMMARY

One or more embodiments of the present disclosure are directed to providing a combined IR imaging device and visual light projector with an improved alignment of a visual representation of IR radiation information to detected infrared (IR) radiation information.

Various techniques are disclosed to solve the following partial problems:

-   -   How to provide improved alignment of a projection image         comprising a visual representation of detected IR radiation         emitted from a real world scene, to said detected IR radiation.     -   How to provide an imaging system for performing the improved         alignment described above at a lower cost.     -   How to enable improved alignment when projecting onto a surface         that is not orthogonal to the optical axis of the visual light         projector.     -   How to enable improved alignment when projecting onto a non-flat         surface.     -   How to enable improved alignment when relative distances between         the optical systems of the visible light projector and the IR         imaging system are unknown.     -   How to enable the improved alignment while providing a flexible         use of a visible light projector in combination with an IR         imaging system, for example when the visible light projector and         the IR imaging system are separate components.

One or more embodiments of the present invention solve or at least minimize the problems mentioned above.

Exemplary embodiments of the present disclosure may facilitate a user registering IR radiation information with an observed real world scene.

Further exemplary embodiments of the present disclosure may provide a visible light projection of IR radiation, the radiation being emitted from an observed real world scene with one or more objects and captured using an IR detector, wherein the visible light projection is projected onto the observed real world scene, object, or objects.

Further exemplary embodiment of the present disclosure may provide a visible light projection that is correctly aligned with the observed real world scene, object, or objects onto which it is projected.

According to one embodiment of the disclosure, there is provided a method for presenting a visible representation of infrared (IR) radiation information onto an observed real world scene based on infrared (IR) radiation emitted from said real world scene, using a thermography arrangement comprising an infrared (IR) imaging system, a visible light imaging system 14 and a visible light projecting system, onto an observed real world scene a visible representation of infrared (IR) radiation information, based on infrared (IR) radiation emitted from said real world scene, wherein the visible representation of infrared (IR) radiation information is presented in alignment with said infrared (IR) radiation emitted from said observed real world scene, the method comprising: detecting infrared (IR) radiation emitted from said observed real world scene or in more specific words capturing infrared (IR) radiation information based on detected infrared (IR) radiation emitted from said observed real world scene, according to a first field of view; creating a visible representation of said detected infrared (IR) radiation in the form of an infrared (IR) image; projecting visible light pattern onto said observed real world scene according to a second field of view, at least partially overlapping the first field of view; capturing a visible light image of said observed real world scene, comprising said projected visible light, according to a third field of view, the third field of view at least partially overlapping the first and/or second field of view; detecting in said captured visible light image said projected visible light pattern; determining the pixel displacement d_((pix vis)) in pixels in the visible light image between the projected visible light pattern pixel coordinates and pixel coordinates in the visible light image where the projected visible light would appear if the visible light imaging system and the visible light projecting system were aligned; determining the pixel displacement d_((pix IR)) between the IR image and the visible light image, based on the pixel displacement d_((pix vis)), based on the pixel displacement d_((pix vis)) between the detected projected visible light pattern and the visible light image; aligning said visible light representation of said detected infrared (IR) radiation, in other words said IR image, to the detected infrared (IR) radiation emitted from said observed real world scene, based on said determined pixel displacement d_((pix IR)); and presenting said aligned IR image by projecting it onto said real world scene according to the second field of view, in alignment with the detected IR radiation emitted from the observed real world scene.

According to another aspect of the invention, there is provided a thermography arrangement for presenting a visible representation of infrared (IR) radiation information onto an observed real world scene based on infrared (IR) radiation emitted from said observed real world scene, wherein the visible representation of infrared (IR) radiation information is presented in alignment with said infrared (IR) radiation emitted from said observed real world scene, the arrangement comprising: an infrared (IR) imaging system 18 for detecting infrared (IR) radiation emitted from said observed real world scene according to a first field of view; a processor adapted transform infrared (IR) radiation data detected by the infrared (IR) imaging system to image data, thereby creating an infrared (IR) image; the arrangement further comprising a visible light projecting system adapted to project a visible light pattern onto said observed real world scene according to a second field of view, at least partially overlapping the first field of view; and a visible light imaging system adapted to capture a visible light image of said observed real world scene, comprising said projected visible light pattern, according to a third field of view, the third field of view at least partially overlapping the first and/or second field of view; said processor further being adapted to detect in said captured visible light image said visible light pattern; determine the pixel displacement d_((pix vis)) in pixels in the visible light image between the projected visible light pattern pixel coordinates and pixel coordinates in the visible light image where the projected visible light would appear if the visible light imaging system and the visible light projecting system were aligned; determine the pixel displacement d_((pix IR)) between the infrared (IR) image and the visible light image, based on the pixel displacement d_((pix vis)) between the detected projected visible light pattern and the visible light image; align said infrared (IR) image to the detected infrared (IR) radiation emitted from said observed real world scene, based on said pixel displacement d_((pix IR)); and said visible light projecting system further being adapted to present said aligned infrared (IR) image by projecting it onto said observed real world scene according to the second field of view, in alignment with the detected infrared (IR) radiation emitted from the observed real world scene.

According to different aspects of the invention, there are further provided a computer system having a processor being adapted to perform any of the steps or functions of the inventive method embodiments; a computer-readable medium on which is stored non-transitory information adapted to control a processor to perform any of the steps or functions of the inventive method embodiments; a computer program product comprising code portions adapted to control a processor to perform any of the steps or functions of the inventive method embodiments and/or a computer program product comprising configuration data adapted to configure a Field-programmable gate array (FPGA) to perform any of the steps or functions of the inventive method embodiments.

Different embodiments of the invention, further described below, provide the advantage of improving alignment for a visual representation of IR radiation information to detected infrared (IR) radiation information.

One or more embodiments of the invention comprises a method of presenting a visible representation of infrared (IR) radiation information onto an observed real world scene based on infrared (IR) radiation emitted from said observed real world scene, using a thermography arrangement 10 comprising an infrared (IR) imaging system 18, a visible light imaging system 14 and a visible light projecting system 22, the method comprising: capturing infrared (IR) radiation information based on detected infrared (IR) radiation emitted from said observed real world scene according to a first field of view of said infrared (IR) imaging system 18; creating a visible representation of said detected infrared (IR) radiation in the form of an infrared (IR) image; projecting a visible light pattern onto said observed real world scene according to a second field of view of said visible light projecting system 22, said second field of view at least partially overlapping said first field of view; capturing a visible light image of said observed real world scene, said scene comprising said projected visible light pattern, according to a third field of view of said visible light imaging system 14, said third field of view at least partially overlapping the first and/or the second field of view; detecting said projected visible light pattern in said captured visible light image of; determining the pixel displacement d_((pix vis)), in pixel coordinates in the visible light image, between the pixel coordinates of said detected visible light pattern and calculated pixel coordinates of said projected visible light pattern where the projected light pattern would appear if the visible light imaging system and the visible light projecting system were aligned, dependent on a predetermined relation between said visible light imaging light imaging system 14 and said visible light projecting system 22; determining the pixel displacement d_((pix IR)), in pixel coordinates in the infrared (IR) image, between the infrared (IR) image and the visible light image, based on said pixel displacement d_((pix vis)) between the detected projected visible light pattern and the visible light image, dependent on a predetermined relation between said infrared (IR) imaging system 18 and said visible light projecting system 22; aligning said infrared (IR) image to the detected infrared (IR) radiation emitted from said observed real world scene, based on said pixel displacement d_((pix IR)); and presenting said aligned infrared (IR) image by projecting it onto said real world scene according to the second field of view in alignment with the detected IR radiation emitted from the observed real world scene.

One or more embodiments of the invention comprises a thermography arrangement 10 for presenting a visible representation of infrared (IR) radiation information onto an observed real world scene based on infrared (IR) radiation emitted from said real world scene, the arrangement 10 comprising: an infrared (IR) imaging system 18 for detecting infrared (IR) radiation emitted from said observed real world scene according to a first field of view; a processor 13 adapted to capture infrared (IR) radiation information based on detected infrared (IR) radiation emitted from said observed real world scene according to a first field of view of said infrared (IR) imaging system 18, thereby creating a visible representation of said detected infrared (IR) radiation in the form of an infrared (IR) image; a visible light projecting system 22 adapted to project a visible light pattern and/or image onto said observed real world scene according to a second field of view, at least partially overlapping the first field of view; a visible light imaging system 14 adapted to capture a visible light image of said observed real world scene, according to a third field of view, the third field of view at least partially overlapping the first and/or second field of view; said processor 13 further being adapted to: project a visible light pattern onto said observed real world scene according to a second field of view of said visible light projecting system 22, said second field of view at least partially overlapping said first field of view; capture a visible light image of said observed real world scene, said scene comprising said projected visible light pattern, according to a third field of view of said visible light imaging system 14, said third field of view at least partially overlapping the first and/or the second field of view; detect said projected visible light pattern in said captured visible light image of; determine the pixel displacement d_((pix vis)), in pixel coordinates in the visible light image, between the pixel coordinates of said detected visible light pattern and calculated pixel coordinates of said projected visible light pattern where the projected light pattern would appear if the visible light imaging system and the visible light projecting system were aligned, dependent on a predetermined relation between said visible light imaging light imaging system 14 and said visible light projecting system 22; determine the pixel displacement d_((pix IR)), in pixel coordinates in the infrared (IR) image, between the infrared (IR) image and the visible light image, based on said pixel displacement d_((pix vis)) between the detected projected visible light pattern and the visible light image, dependent on a predetermined relation between said infrared (IR) imaging system 18 and said visible light projecting system 22; align said infrared (IR) image to the detected infrared (IR) radiation emitted from said observed real world scene, based on said pixel displacement d_((pix IR)); and present said aligned infrared (IR) image by projecting it onto said real world scene according to the second field of view, in alignment with the detected IR radiation emitted from the observed real world scene.

Furthermore, the following advantages are achieved by embodiments of the invention:

-   -   Improved alignment of a projection image comprising a visual         representation of detected IR radiation emitted from a real         world scene, to said detected IR radiation is achieved.     -   An imaging system for performing the improved alignment         described above is provided at a low cost.     -   Improved alignment when projecting onto a surface that is not         orthogonal to the optical axis of the visual light projector is         achieved.     -   Improved alignment when projecting onto a non-flat surface is         achieved.     -   Improved alignment is obtained even when relative distances         between the optical systems of the visible light projector and         the IR imaging system are unknown.     -   Improved alignment is achieved while providing a flexible use of         a visible light projector in combination with an IR imaging         system, for example when the visible light projector and the IR         imaging system are separate components.

BRIEF DESCRIPTION OF THE DRAWINGS

The present invention is further described below by way of exemplifying embodiments with reference to the accompanying drawings, in which:

FIG. 1A-1C show schematic views of a thermography arrangement according to different exemplifying embodiments of the disclosure.

FIG. 2 shows a schematic view of an arrangement of the three optical systems of a thermography arrangement in relation to an observed scene in accordance with embodiments of the disclosure.

FIG. 3A shows a schematic view of an optical system of an IR imaging system used on a surface that is non-orthogonal to the optical axis of a visual light projector, according to an exemplifying use case enabled by embodiments of the disclosure.

FIG. 3B shows a schematic view of an optical system of a thermography arrangement used on a non-flat surface, according to another exemplifying use case enabled by embodiments of the disclosure.

FIG. 3C shows an exemplary embodiment wherein the optical axis OA of a projector of a thermography arrangement falls obliquely onto a surface in a scene.

FIG. 4A is a block diagram showing calibration/alignment during production according to embodiments.

FIG. 4B is a block diagram showing self-calibration/alignment according to embodiments.

FIG. 5 is a flow chart of a method performing alignment of a projection image to detected IR radiation information according to embodiments of the disclosure.

FIG. 6 is a block diagram showing adjustment/alignment during operation according to embodiments.

FIG. 7 is a schematic overview of different modes according to embodiments.

FIG. 8 is a block diagram showing operation of a calibrated/aligned thermography arrangement according to embodiments.

DETAILED DESCRIPTION Introduction

Embodiments of the present invention thus relates to solutions for IR (infrared) imaging, also referred to as thermography imaging, where instead of or in addition to indirect view on a display arrangement as is the common case with IR imaging arrangements, or thermography arrangements, an infrared image is superimposed onto the real world scene using a projection of visible light in real time or near real time. This means that a user can use his or her normal vision to observe a real world scene wherein the visible light projected onto the scene makes it easier for the user to interpret and/or analyze the observed scene. For instance, the projected visible light may highlight objects or areas of interest in the observed scene.

According to embodiments of the invention, there are provided methods and arrangements for presenting onto an observed real world scene a visible representation of IR radiation information, based on IR radiation emitted from the observed real world scene, using a thermography arrangement 10 comprising an IR imaging system 18, a visible light imaging system 14 and a visible light projecting system 22.

According to embodiments of the invention, there are provided a method and thermography arrangement 10 of presenting a visible representation of infrared (IR) radiation information onto an observed real world scene based on infrared (IR) radiation emitted from said observed real world scene, using a thermography arrangement 10 comprising an infrared (IR) imaging system 18, a visible light imaging system 14 and a visible light projecting system 22.

According to embodiments of the invention, the visible representation of infrared (IR) radiation information is presented in alignment with said infrared (IR) radiation emitted from said observed real world scene.

According to an embodiment, the IR imaging system 18 is adapted to detect infrared (IR) radiation emitted from an observed real world scene according to a first field of view.

According to an embodiment, there are provided methods detect infrared (IR) radiation emitted from an observed real world scene according to methods known per se in the art, e.g., in one or more conventional ways as would be understood by one skilled in the art.

According to an embodiment, the processor 3 is adapted to transform infrared (IR) radiation data information detected by the infrared (IR) imaging system 18 to a visible representation, thereby creating an infrared (IR) image. In this manner a visible representation of detected infrared (IR) information is created.

According to one or more embodiments, the thermography arrangement comprises a visible light imaging system 14, and wherein aligning comprises using said visible light imaging system for example as follows.

According to an embodiment, there are provided methods for transforming infrared (IR) radiation data detected by the infrared (IR) imaging system 18 to image data, according to methods known per se in the art, e.g., in one or more conventional ways as would be understood by one skilled in the art.

According to an embodiment, the visible light projecting system 22 is adapted to project visible light pattern onto the observed real world scene according to a second field of view, at least partially overlapping the first field of view.

According to an embodiment, the visible light imaging system 14 is adapted to capture a visible light image of the observed real world scene, comprising said projected visible light pattern, according to a third field of view, the third field of view at least partially overlapping the first and/or second field of view.

According to an embodiment, the processor 13 is further adapted to detect in said captured visible light image said projected visible light pattern; determine the pixel displacement d_((pix vis)) in pixels in the visible light image between the projected visible light pattern pixel coordinates and pixel coordinates in the visible light image where the projected visible light would appear if the visible light imaging system and the visible light projecting system were aligned in pixels in the visible light image between the projected visible light pattern pixel coordinates and pixel coordinates in the visible light image where the projected visible light would appear if the visible light imaging system and the visible light projecting system were aligned; determine the pixel displacement d_((pix IR)) between the IR image and the visible light image, based on the pixel displacement d_((pix vis)) between the projected visible light pattern and the visible light image; and align said visible light representation of said detected infrared (IR) radiation, also referred to as infrared (IR) image, to the detected infrared (IR) radiation emitted from said observed real world scene, based on said pixel displacement d_((pix IR)); presenting said aligned infrared (IR) image by projecting it onto said real world scene according to the second field of view, in alignment with the detected IR radiation emitted from the observed real world scene.

According to an embodiment, the processor 13 is further adapted to:

-   -   Calculating the second field of view based on pixel distance         between predetermined points in the captured visible light image     -   determining a parallax distance calibration parameter Co-3-1 and         a pointing error calibration parameter C1-3-1 of the optical         axis OA3 of said infrared (IR) imaging system 18 and the optical         axis OA1 of visible light imaging system 14;         determining a parallax distance calibration parameter Co-2-1 and         a pointing error calibration parameter C1-2-1 of the optical         axis OA2 of said visible light projecting system 22 and the         optical axis OA1 of visible light imaging system 14; and         determining a parallax distance calibration parameter Co-2-3 and         a pointing error calibration parameter C1-2-3 of the optical         axis OA2 of said visible light projecting system 22 and the         optical axis OA3 of said infrared (IR) imaging system 18.

In one embodiment the parallax distance calibration parameter for a first optical axis of a first optical system and a second optical axis of a second optical system is dependent on the field of view of the second optical system and the parallax distance between the first optical system and the second optical system and; wherein the pointing error calibration parameter for a first optical axis of a first optical system and a second optical axis of a second optical system is dependent on a pixel displacement, said parallax distance calibration parameter for a first optical axis of a first optical system and a second optical axis of a second optical system and an obtained distance value z from the first optical system to the observed real world scene.

In one embodiment the detecting in said captured visible light image of said projected visible light pattern is performed based on the distance value.

In one embodiment, performing detection comprises starting detection in a location in the captured visible light image given by a predetermined relationship between the distance value z and a location in the captured visible light image.

In one embodiment the distance value z is obtained as a predetermined value.

In one embodiment said distance value z is obtained 470 by means of a sensor.

In one embodiment, determining the pixel displacement d_((pix IR)) between the infrared (IR) image and the visible light image is performed dependent on a predetermined relationship between the pixel displacement d_((pix IR)), the pixel displacement d_((pix vis)) between the detected projected visible light pattern and the visible light image and the distance value z.

In one embodiment the predetermined relationship is a mapping function in the form of a lookup table.

In one embodiment the method steps projecting a visible light pattern, capturing a visible light image, detecting in said captured visible light image, determining the pixel displacement, determining the pixel displacement d_((pix IR),aligning) and presenting said aligned infrared (IR) image continuously during operation of the thermography arrangement 10.

In one embodiment more than one distance from the thermography arrangement 10 to more than one point in the observed scene may is obtained and turned into a distance map.

In one embodiment presenting said aligned infrared (IR) image comprises adapting projection of pixels of said aligned infrared (IR) image, dependent on the distances of the distance map.

In one embodiment adapting projection of pixels comprises to project pixels with varying density, dependent on the distances of the distance map.

In one embodiment said density is varied so that if the distance z_(i) to the point i onto which pixels of said aligned infrared (IR) image are to be projected exceeds a preset threshold pixels are projected more sparsely.

In one embodiment the method further comprises:

-   -   detecting a hot spot in the detected infrared (IR) radiation         emitted from said observed real world scene,     -   presenting said aligned infrared (IR) image by projecting it         onto said real world scene, wherein the parts of the aligned         infrared (IR) image comprising detected hot spot is projected         with a color or light intensity different than the parts of the         aligned infrared (IR) image not comprising a detected hot spot.

According to an embodiment, the processor 13 is further adapted to retrieve the distance z from the IR thermography arrangement 10 to the observed scene. According to further embodiments, the processor 13 is adapted to determine the pixel displacement d_((pix vis)) between the detected projected visible light and the visible light image based on the retrieved distance z; and/or determine the pixel displacement d_((pix IR)) between the IR image and the visible light image, based on the pixel displacement d_((pix vis)) between the detected projected visible light and the visible light image and the retrieved distance z.

According to an embodiment, the visible light projecting system 22 is further adapted to present an aligned visible representation of detected infrared (IR) radiation, in other words an IR image, by projecting it onto said real world scene, in alignment with the detected IR radiation emitted from the scene.

According to embodiments, the visible representation of IR radiation information is presented in alignment with the IR radiation emitted from the observed real world scene. Embodiments of the presentation method are described further below, in connection with FIG. 5.

An arrangement adapted for this purpose comprises three optical systems, viz. an IR imaging system, a visible light imaging system and a visible light projecting system. In different embodiments, the three optical systems are either assembled into one integrated thermography arrangement or are devised with the projector as a separate component. In the case where the projector is a separate component it may be adapted to be detachably attached to an assembly or housing comprising the other optical systems or be adapted to operate physically separated from the other optical systems.

All components/units of the thermography arrangement are communicatively coupled, for example through direct connection, wired connection, wireless connection.

The optical systems of the thermography arrangement have different fields of view (FOV). In order to achieve alignment according to the present invention, the optical systems of the thermography arrangement must be placed such that the FOV of each optical system at least partly overlaps with the FOVs of the other two optical systems.

Since the optical systems of the thermography arrangement do not have the same optical axis parallax error will occur. To compensate for the parallax error, the images must be aligned.

Some of the information that is used in the calculations needed to perform alignment according to the present invention may be determined during calibration of the camera, as described in more detail below.

Integrated Device Embodiment

FIG. 1A shows a schematic view of a system according to a first embodiment of the invention wherein an integrated thermography arrangement 10 comprising three optical systems 14, 18 and 22. According to an embodiment, the optical systems 14, 18, 22 are comprised in an assembly 12. The first two optical systems are a visible light imaging system 14 which comprises a visible light sensor array 16 for the visual spectrum of light, and an IR imaging system 18 comprising an IR sensor array 20 for the infrared spectrum of light. The third optical system comprised in the assembly 12 is a visible light projecting system 22 or possibly a light projecting system adapted to project light in normally non-visible wavelength areas such as ultraviolet (UV). According to this embodiment, the three optical systems 14, 18, 22 have a fixed mounting with known relative distances and angles between the respective optical axes OA1, OA3, OA2 as determined through calibration which is a kind of alignment, for instance performed during production of the thermography arrangement. The optical systems of the thermography arrangement 10 are mounted such that the FOV of each optical system at least partly overlaps with the FOVs of the other two optical systems, respectively, as illustrated in the embodiment shown in FIG. 2.

Detachably Attachable Components Embodiment

FIG. 1B shows a schematic view of a system according to a second embodiment of the invention wherein a thermography arrangement 10 comprises the three optical systems 14, 18, 22. The two imaging systems 14, 18 have a fixed mounting with known relative distances and angles between the respective optical axes OA1, OA3 (Cf, FIG. 2) as determined through calibration/alignment, for instance performed during production of the thermography arrangement. According to an embodiment, the visible light imaging system 14 and the IR imaging system 18 are comprised in an assembly 12. The projecting system 22 is according to this embodiment a separate component adapted to be detachably attached to the thermography arrangement 10 by means of attachment features 25A and 25B. Attachment feature 25A is provided on the projecting system 22 and is adapted to fit to a corresponding attachment feature 25B provided on the thermography arrangement 10. According to embodiments, when attached, the projecting system 22 is communicatively coupled to the processor 13 of the thermography arrangement 10 via a communication interface 21 further explained below and a corresponding communication interface 27. According to different embodiments, the communication interface 21 may be integrated in, implemented in, or coupled to any of the projecting system 22 or attachment feature 25A, while the communication interface 27 may be integrated in, implemented in, or coupled to any of the imaging systems 14 or 18, assembly 12, processor 13 or attachment feature 25B.

According to an embodiment, when the attachment features 25A, 25B are attached to each other, the visible light projection system 22 will be positioned with a certain distance and angle compared to the IR imaging system 18 and to the visible light imaging system 14, respectively. According to embodiments, the attachment features 25A, 25B may comprise a socket, a receptacle into which a tapered tool is inserted, and/or be attached to each other by a selection of the following: by means of thread, wherein one of the features 25A, 25B is screwed into the other, by fitting, snapping or clicking one of the features 25A, 25B to the other, by use of magnetism, or by use of any other suitable type of fastening or attachment mechanism. The attachment features are placed and designed such that said distances and angles between the visible light projection system 22 on the one hand and the IR imaging system 18 and the visible light imaging system 14 on the other hand will be substantially the same each time the attachment features are attached to each other, with a minor margin of error. By assuring in production of the thermography arrangement that the relative placements of the combined optical systems will be substantially the same every time the IR imaging is used a parallax error, such as parallax distance and pointing error, between the visible light projection system 22 and the visible light imaging system 14 and IR imaging system 18, respectively, may be known from production, calibration/alignment during production, or approximated during use.

When the components are attached, the optical systems, systems 14, 18, 22, of the thermography arrangement 10 are positioned such that the FOV of each optical system at least partly overlaps with the FOVs of the other two optical systems, as exemplified in FIG. 2.

Separate Components Embodiment

FIG. 1C shows a schematic view of a system according to a third embodiment of the invention wherein a thermography arrangement 10 comprises the three optical systems 14, 18, 22. The two imaging systems 14, 18 have a fixed mounting with known relative distances and angles between the respective optical axes known from production or calibration during production. According to an embodiment, the visible light imaging system 14 and the IR imaging system 18 are comprised in an assembly 12. The projecting system 22 is according to this embodiment a separate component adapted to be placed physically separated and possibly at a remote distance from the other components of the thermography arrangement 10 during operation. The projecting system 22 is communicatively coupled to the processor 13 via a communication interface 21 further explained below.

In operation according to this third embodiment, the projecting system 22 should be placed such that its FOV at least partly overlaps with the FOV of the IR imaging system and the visual light imaging systems. In order to accomplish or assist in achieving at least partly overlapping FOVs the projector may be adapted to project a predetermined guide projection of visible light, e.g. in the form of an identifiable feature such as a pattern, to guide a user in placing the projecting system 22 in such a position that it projects its projection FOV onto the scene or object that the user intends to observe.

Further System Architecture Details

Referring to all the embodiments shown in FIGS. 1A-1C, the imaging systems 14, 18 comprise, according to embodiments, one or more lenses, control devices for adjusting the lenses, sensors 16, 20 adapted to capture the incoming radiation from an observed scene and coupled to one or more processors 13 provided with processing features adapted for processing image data received from the sensors 16, 20 as well as controlling functions of the different parts of the system. Optionally, the thermography arrangement 10 comprises a display 23 coupled to the processor 13 and being adapted to display image data. Optionally the thermography arrangement 10 comprises a graphical user interface (GUI) configured to display information to the user and to obtain user input information

According to different embodiments, the thermography system 10, including or excluding the visible light projecting system 22, may be handheld, adapted to be fixedly mounted, for instance for surveillance purposes or maintenance investigations, or adapted to be mounted on a stand during use.

According to an embodiment, the thermography arrangement 10 further comprises a memory 15 for storing the data registered or processed by the thermography arrangement 10 as well as a selection of one or more control devices 19 for inputting commands and/or control signals, e.g. an interactive display, joystick and/or record/push-buttons and at least one communication interface 21, e.g. wired or wireless connections, IRDA, Bluetooth, USB, Fire-Wire, etc. In response to input commands and/or control signals, the processor(s) 13 controls functions of the different parts of the thermography arrangement 10.

According to different embodiments, the projecting system 22 may comprise a projector 29 e.g. in the form of a laser projector, a liquid crystal display (LCD) projector, a digital light processing (DLP) projector or any other suitable type of projector known in the art.

A laser projector may be suitable in many applications since a laser projector typically has a high depth of field, whereby projection of images or data onto any kind of projection surface is enabled. Typically the sharpness, color space, and contrast ratio are higher than those of other projection technologies, for example LCD or DLP projectors.

The thermography arrangement 10 may further comprise a laser pointer, not shown in the figures, per se known in the art. Such as laser pointer may applied in the present inventive concept for example be used to project visible light. According to embodiments, the visible light may be projected as an identifiable feature in the form of a limited pattern comprising all or parts of the pixels comprised in the field of view of the projecting system, herein also denoted FOV_(proj).

Embodiments for parallax compensation, calibration and alignment are described below, in connection with FIGS. 2-8.

Use Case Embodiments

In operation, according to an embodiment, an operator aims a handheld thermography arrangement 10 at an observed real world scene that may e.g. comprise a pipe, a wall, a floor, a ceiling or any other one or more target surfaces or objects of interest for investigation and directly sees a visible representation of emitted and detected IR radiation projected onto the observed real world scene, in alignment with the observed real world scene in such a way that the visible representation is projected in the same direction as from where the corresponding detected IR radiation was emitted. For instance, if the scene comprises a hot spot, for example an overheated electrical component, the user will see light projected onto the detected hot spot, for example in a color or light intensity that indicates that the temperature of the detected hot spot is high. According to embodiments, the light projected onto the hot spot may be red, typically used for representing a hot temperature on a color scale, or light of high intensity, if grey scale values are used for the projection. As is readily apparent to a person skilled in the art, any suitable visible representation may be used for the range of thermal, IR or temperature information detected in the observed real world scene.

According to different embodiments, further described below, the user may use the thermography arrangement to light up or highlight areas or interest in an observed scene or receive a warning in the form of a visible alarm being projected onto the scene when an abnormality is detected.

According to another embodiment, the user may use the thermography arrangement to retrieve the distance to an observed scene. The distance from the thermography arrangement to the observed scene will hereinafter be referred to as z, wherein z is a parameter that indicates the distance from the thermography arrangement to the observed scene.

According to embodiments, the value of the distance parameter z may for instance be retrieved by calculation using relationships with known parameter and/or parameters that the thermography arrangement is enabled to retrieve, for instance the relationship of Eq. 2 presented below. According to alternative embodiments, the distance parameter value z may be retrieved by use of double visible light sensors, by detection of a laser spot in an IR image, by the position of the focus lens or by the use of a distance sensor integrated in or coupled to the thermography arrangement in per se known manners.

In order for the thermography arrangement to work as a distance meter, through calculation using relationships with known parameter and/or parameters that the thermography arrangement is enabled to retrieve, it must first be calibrated/aligned. Alternative calibration/alignment embodiments are described below.

According to an embodiment, the operator may select to activate an alignment function using input features comprised in the one or more control devices 19. According to another embodiment, the alignment function is automatically activated when the thermography arrangement 10 is turned on.

According to embodiments wherein the visible light projecting system 22 is a detachably attachable component, as exemplified in FIG. 1B, and presently not attached to the handheld thermography arrangement 10, the operator attaches the visible light projecting system 22 to the handheld thermography arrangement 10 before use.

According to an alternative embodiment, wherein the visible light projecting system 22 and the handheld thermography arrangement 10 are to be used as physically separated components, the operator places the visible light projecting system 22 in a suitable position relative to the handheld thermography arrangement 10, making sure that the projecting system 22 is directed towards target surfaces or objects of interest for investigation, i.e. the observed real world scene. Possibly, the operator is guided in directing the visible light projector towards the target surfaces or objects of interest for investigation by the visible light projecting system 22 being adapted to project a predetermined guide projection of visible light, e.g. an identifiable feature in the form of a pattern or a symbol. According to embodiments, the visible light may be projected as an identifiable feature in the form of a limited pattern comprising all or parts of the pixels comprised in the field of view of the projecting system (FOV_(proj)). Such a projection may for instance be automatically activated when the visible light projecting system 22 is turned on, or be controlled to be activated by input from the operator. The operator may provide input using for example an input device integrated in or coupled to the visible light projecting system 22, not shown in the figure, or the control devices 19 of the thermography arrangement 10, whereby the processor 13 translates the input signal from the control device(s) 19 to a control signal that is communicated to the visible light projecting system 22 via the interface 21, in order to control the activation of the described guiding projection. The visible light projecting system 22 is communicatively coupled to the processor of the thermography arrangement by means of a wired or wireless connection, for instance communicating via communication interfaces 21 and 27.

According to an embodiment, the IR imaging system 18 of the IR imaging system 10 detects IR radiation emitted from the observed scene and captures said IR radiation using an IR sensor array 20 comprised in the IR imaging system 18. In the IR sensor array 20, the incoming IR radiation is turned into an IR radiation signal comprising IR radiation data. The captured IR radiation data is transmitted from the IR sensor array 20 to the processor 13, wherein the detected IR radiation data is transformed to a visible representation of image data in the form of an IR image. According to an embodiment the IR image is transferred to a display 23 of the thermography system 10 and presented to the operator of the device. However, the display of the IR image on a camera display is optional according to method embodiments of the present invention.

According to an embodiment, the visible light projecting system 22 is controlled by the processor 13 to project visible light onto the observed real world scene. According to embodiments, the visible light may be projected as an identifiable feature in the form of a limited pattern or symbol comprising all or parts of the pixels comprised in the field of view of the visible light projecting system 22, (FOV_(proj)). According to embodiments, the projection is performed in parallel with but not necessarily at the same time instance as the capturing and processing of IR radiation information.

According to embodiments, a pattern or symbol in the context of the present invention is a shape or distribution consisting of at least one pixel and preferably more than one pixel, typically a number of pixels, which are easily distinguishable from anything that may appear in an image of an observed scene. For instance, the symbol is in preferred embodiments not in the form of a single pixel or a few pixels grouped together, since a single pixel or small pixel group may be confused with noise appearing in the image. The symbol of the present invention may have the shape of an object recognizable by the human eye, such as a flower, a star or any other object known to a human. Alternatively, it may have a shape or distribution that is not interpreted as a certain object by a human, but that is easily recognizable by the human eye and/or a data processor. Similarly, a pattern in the context of the present invention also consists of more than one pixel, typically a number of pixels, which are easily distinguishable from anything that may appear in an image of an observed scene, as well as from noise. According to an embodiment, the symbol or pattern may have the shape of an object known to man or any other suitable shape or distribution that renders it easily recognizable by the human eye and/or a data processor. According to an embodiment, the pattern projected by the visible light projecting device 22 is simply all or selected parts of the pixels comprised in the FOV_(proj). In this case, the pattern may be identified or recognized, in a visible light image comprising the pattern, based on the intensity of the projected visible light. The pixels wherein visible light is projected are likely to have a higher intensity remaining pixels of the visible light image.

According to an embodiment, during projection of the predetermined symbol or pattern, the visible light imaging system 14 is controlled by the processor 13 to capture incoming visible light using a visible light sensor array 16 comprised in the visible light imaging system 14. In the visible light sensor array 16, the incoming visible light is turned into a visible light signal comprising visible light data. The captured visible light data is transmitted from the visible light sensor array 16 to the processor 13, wherein the visible light data is transformed to a visible light image. Since the sensor elements of the visible light sensor array 16 are sensitive to the wavelength of the visible light, the reflected light of the visible light projecting system 22 may be detected in the visual image by its picture elements, i.e. pixels. The picture elements may for example be CCDs (charge-coupled devices). The captured visible light image thereby comprises a visible representation of the real world scene superimposed by the predetermined symbol or pattern that is being projected onto it.

According to an embodiment, after an image comprising a visible representation of the real world scene superimposed by the predetermined symbol or pattern is captured, the image is transmitted to the processor 13, which performs detection of the predetermined symbol or pattern in the image. Detection of the symbol or pattern in the image may be performed using any suitable detection method, per se known in the art, for example feature extraction, template matching, segmentation, edge detection, thinning, similarity measures, masking, filtering or by using a difference image.

According to an embodiment, wherein the symbol or pattern detection is to be performed using a difference image, the visible light imaging system 14 is further controlled by the processor 13 to capture an image of the same observed real world scene without the predetermined symbol or pattern projected onto it, at a time instance close to the time instance when the image comprising the observed real world scene and the predetermined symbol or pattern is captured. It does not matter which of the images is captured first and which is captured last. Preferably, the two images are two successive image frames in an image frame sequence. The reason for capturing the images in close succession to each other is that the observed real world scene normally will not have changed much from the first image frame to the second, meaning that the real world image part of the images will be substantially the same. Furthermore, in the embodiment wherein the thermography arrangement 10 is handheld, any shaking or moving of the arrangement caused by the user will be small if the images are captured in close succession, for example as two consecutive image frames in an image frame sequence. Thereby, when the processor 13 subtracts the image comprising only the representation of the observed real world scene from the image further comprising the projected symbol or pattern, a difference image comprising only the projected symbol or pattern will be obtained. In this way, any symbols or patterns present in the observed real world scene, for example patterns on a wallpaper of a wall, may not wrongfully be detected as a symbol or pattern by the thermography arrangement 10.

The visible representation of IR information, also referred to as the IR image, is transmitted from the processor 13 to the visible light projecting system 22. The visible light projecting system 22 is further controlled by the processor 13 to project the visible representation of IR information onto the real world scene such that the visible light representation of the detected IR radiation is aligned with the incoming, or captured, IR radiation and projected onto the real world scene in the same direction as from where the corresponding captured IR radiation was emitted. In order to achieve this alignment, the processor 13 uses the information on the detected symbol or pattern along with information retrieved during production, calibration in production, and/or calibration or adjustment during operation of the thermography arrangement 10. Alignment embodiments are described in further detail below.

Representing Detected Infrared (IR) Radiation and Identifying Areas, e.g. Objects

According to embodiments of the present invention, the operator of the thermography arrangement 10 will experience that the events described above are performed instantly, in real time, meaning that the operator aims the thermography arrangement 10 at an observed real world scene comprising e.g. a surface or an object of interest and directly sees a visible representation of emitted and detected IR radiation projected onto the observed real world scene, in alignment with the scene in such a way that the visible representation is projected in the same direction as from where the corresponding detected IR radiation was emitted. The visible representation of IR information is typically colors or gray scale levels representing different thermal properties of the observed real world scene, such as surfaces or objects, onto which it is projected. Using the alignment method of the present invention, the visible representations projected onto the real world scene will be projected in the direction from which the corresponding detected IR radiation was emitted. For instance, projection of the visible representation of said detected infrared (IR) radiation in the form of an infrared (IR) image is performed such that different thermal properties of the detected infrared (IR) radiation emitted from said observed real world scene are represented. An example of this is if IR radiation representing low thermal values or temperatures is detected in a certain part of the observed real world scene, the visible light projecting system 22 will project onto this part of the observed real world scene light having a color or a gray scale value representing said low thermal or temperature value, according to e.g. the color scale or range of gray scale values selected.

In one embodiment an area in the observed real world scene where the detected infrared (IR) radiation emitted from said observed real world scene is deviating from surrounding areas can be detected, e.g. relating to an object in the observed real world scene. In one embodiment the deviation is detected by comparing the detected infrared (IR) radiation in the area to a mean value of the detected infrared (IR) radiation relating to surrounding areas, e.g., part of the detected infrared (IR) radiation un the immediate surroundings or all of the detected infrared (IR) radiation. The detection of an area with lower detected infrared (IR) radiation, e.g. in the form of thermal values or temperatures, than the mean detected infrared (IR) radiation of surrounding areas is sometimes referred to as detection of a “cold spot”, which may indicate that the area for instance is poorly insulated, or is exposed to water leakage or formation of condensation and thereby has an increased risk of being water damaged. The detection of an area with higher detected infrared (IR) radiation, e.g. in the form of thermal values or temperatures, than the mean detected infrared (IR) radiation of surrounding areas is sometimes referred to as detection of a “hot spot”, which may indicate for instance that the area comprises overheated components and has an increased risk of catching fire. If a color scale representing detected infrared (IR) radiation of the observed real world scene ranging from blue for low temperatures to red for high temperatures is used, a cold spot in the real world scene would typically have blue colored light projected onto it, while a hot spot in the real world scene would have red colored light projected onto it by the visible light projecting system 22. The operator is thereby enabled to see the hot and cold spots directly in the real world scene that he or she is investigating, in alignment with the scene, even if the cause of the low or high thermal or temperature values is on the other side of a surface at which the operator is aiming the IR imaging system 10.

The red and blue areas described above are by means of example only. Any color scale, gray scale, or other suitable visible representation may be used by the visible light projecting system 22 to represent the different IR radiation levels detected. For instance, different IR radiation levels may be represented by different patterns or light intensities.

Aligning of IR image to projected IR image

The visible light projecting system 22 may project visible light according to the selected visible representation of detected IR radiation levels onto the parts of the real world scene that are within its entire FOV if the FOV of the visible light projecting system 22 is completely comprised in the FOV or the IR imaging system 18. Alternatively, if the FOV of the visible light projecting system 22 only partly overlaps with the FOV or the IR imaging system 18, the visible light projector may project visible light onto the parts of the scene that lie within the overlapping part of the FOVs of the two systems. Alternatively, the visible light projecting system 22 projects visible light only onto parts of the real world scene from which IR radiation above, is below or between certain selected temperature values or intervals has been detected and that lies within the overlapping part of the FOVs of the two systems. Other selections of which parts of the overlapping FOVs the visible light projecting system 22 should project light onto could also be considered. For example, visible light may be projected onto areas of interest indicated by the operator, using input features of the IR imaging system 10, or onto objects detected in the image by object detection features implemented in the processor 13. According to an embodiment, illustrated in FIG. 2, the visible light imaging system 14 has the largest FOV, the IR imaging system 18 has the second largest FOV and the projecting system 22 has the smallest FOV. However, any other relationship in FOV sizes is conceivable, depending on circumstances such as price, performance and end customer requirements.

Since the projected visible light is aligned with the detected IR radiation emitted from the real world scene and projected in the direction from which the detected IR radiation was emitted, no visible light will be projected onto parts of the real world scene that does not fall within the FOVs of both the IR imaging system 18 and the visible light projecting system 22.

According to an embodiment, different aspects of the invention described herein may provide an alarm, thereby notifying or alerting a user when an alarm criterion is fulfilled, for example indicating that a possible abnormality of some sort has been detected. The alarm may be visible or audible to the user.

According to embodiments, the projecting system 22 may be controlled, for example by the processor 13, to project the aligned visible light onto the scene if one or more of the following criteria are fulfilled: one or more parts of detected infrared (IR) radiation emitted from said observed real world scene has a detected value above a preset threshold limit; one or more parts of the detected infrared (IR) radiation emitted from said observed real world scene has a detected value below a preset threshold limit; one or more parts of the detected infrared (IR) radiation emitted from said observed real world scene has a detected value within a preset interval; or one or more parts of the observed scene has a measurement value outside a preset interval.

According to embodiments, the measurement values may relate to detected infrared (IR) radiation emitted from said observed real world scene, temperature or thermal information, effect or power (W, W/m²), humidity or moisture, for example indicated as a percentage.

According to embodiments, the criteria mentioned above are alarm criteria, intended to alert the user that a possible deviation or abnormality has been detected. As an example a criteria can be that all or parts of the detected infrared (IR) radiation emitted from said observed real world scene is above a predefined threshold.

According to embodiments, one or more criteria for controlling the projection may be preset or selected by the user through input using for example one or more of the control devices 19.

According to an embodiment, the projecting system 22 is controlled to provide an alarm by:

-   -   if the projector was already projecting: flashing, increasing         brightness, adjusting the projection color and/or project         visible light only onto the part or parts of the image wherein         said one or more criteria are fulfilled;     -   if the projector was not projecting: start projecting visible         light onto the part or parts of the image wherein said one or         more criteria are fulfilled or onto the entire observed scene,         thereby alerting the user that a possible deviation or         abnormality has been detected.

According to different embodiments, an alarm may be provided by use of the visible light projecting system 22, for instance by controlling the visible light projecting system 22 to start projecting when one or more of the an alarm criteria above is fulfilled, if the visible light projecting system 22 was not already projecting or to start blinking or flashing if it was already projecting light onto the observed real world scene.

In other words, according to embodiments, the visible light projecting system 22 may be controlled to provide an alarm by:

-   -   if the projecting system 22 was already projecting: flashing,         increasing brightness, adjusting the projection color and/or         project visible light only onto the part or parts of the image         wherein said one or more criteria are fulfilled; or     -   if the projecting system 22 was not projecting: start projecting         visible light onto the part or parts of the image wherein said         one or more criteria are fulfilled or onto the entire observed         real world scene, thereby alerting the user that a possible         deviation or abnormality has been detected.

According to other embodiments, the visible light projecting system 22 may be adapted to highlight an identified area relating to the alarm criterion by starting to project or flash light onto that identified area or an area related to the identified area, in close proximity to the identified area. According to different embodiments, the visible light projected may comprise light of any suitable color, color range, grey scale range and/or intensity and be presented in any suitable size, shape and/or pattern.

According to another embodiment, the thermography system 10 may comprise one or more speaker units and be adapted to provide an alarm in the form of an audible signal.

Field of View (FOV) and Parallax Errors

FIG. 2 illustrates the field of view (FOV) of the visible light imaging system 14, of the thermography arrangement 10 of FIG. 1, represented as an angle α, the FOV of the infrared imaging system 18 represented as an angle β, and the FOV of the visible light projecting system 22 represented as an angle γ. The optical axes of the three optical systems 14, 18 and 22 are shown as dashed lines OA1, OA3 and OA2, respectively.

Two factors contribute to the relative displacement of images and/or projections produced by different imaging systems. First, the respective distances between the imaging systems 14, 18, 22 causes a displacement, also referred to as parallax distance, of the images that is constant in meters, e.g. P_((pix vis)), but decreases in number of pixels, e.g. d_((pix vis)), with increasing distance to the object. Second, the optical axes OA1, OA3, OA2 of the different imaging systems 14, 18, 22 are normally not perfectly parallel. The respective angle between them causes a displacement, also referred to as a pointing error or directional error, which varies in meters with the distance to the object but is constant in number of pixels. A pointing error, or directional error, is caused by the difference in angle between the optical axes of two of the optical system compared to the desired angle, and occurs due to construction inaccuracies. For instance, when the visible light imaging system 14 and the IR imaging system 18 are assembled in production, they will not be assembled in exactly the same way for every thermography arrangement to. Slight differences will occur, and thereby also directional errors.

According to an embodiment, the term parallax error as used in the present text includes the combined pixel displacement caused by the distance between the imaging subsystems and the angle between the optical axes.

As can be seen in FIG. 2, there is a parallax distance P_((p-vis)) between the optical axis OA2 of the projecting system 22 and the optical axis OA1 of the visible light imaging system 14, and another parallax distance P_((p-IR)) between the optical axis OA2 of the projecting system 22 and the optical axis OA3 of the IR imaging system 18.

The parallax distance P_((p-vis)) causes a pixel displacement between a visual image projected by the visible light projecting system 22 and an image captured by the visible light imaging system 14. This pixel displacement is hereinafter denoted d_((pix vis)).

The parallax distance P_((p-IR)) causes a pixel displacement between a visual image projected by the visible light projecting system 22 and an IR image captured by the IR imaging system 18. This pixel displacement is hereinafter denoted d_((p-IR)).

As is readily apparent to a person skilled in the art there is further a parallax distance P_((vis-IR)) between the optical axis OA1 of the visible light imaging system 14 and OA 3 of the IR imaging system 18, causing a pixel displacement between an image captured by the visible light imaging system 14 and an IR image captured by the IR imaging system 18. According to all embodiments of the present invention, the visible light imaging system 14 and the IR imaging system 18 are integrated in the assembly 12, whereby the parallax distance P_((vis-IR)) is known from production and may be compensated for during calibration/alignment or operation of the thermography arrangement 10.

In one embodiment the pixel displacements d_((pix vis)) and dd, shown in FIG. 2, may be determined empirically as a function of the distance z_((x,y)) that represents the distance from the thermography arrangement 10 to each of a selection of points on the observed real world object, objects or scene, for example during production or calibration of the thermography arrangement 10. According to an embodiment, the distance z may be described as the distance to the part of the scene representing a specific coordinate in the captured visual image in which the projected pattern is detected, in combination with the parallax distance P_((p-vis)) between the visible light projecting system 22 and the visible light imaging system 14.

In one embodiment the determination of the pixel displacements as a function of the distance z from the thermography arrangement to the observed scene may hence be performed for the visible light imaging system 14 and the IR imaging system 18, respectively, using methods known per se.

According to an embodiment, the determined pixel displacements as a function of the distance z are stored in a memory in the thermography arrangement 10, for example, the memory storage 15, and can be used to compensate for parallax errors during operation.

According to embodiments, the distance z is determined relative to a predetermined coordinate in the image representing the observed real world scene, such as the center of the image, a corner of the image or any other suitable coordinate in the image.

The respective parallax distances P_((p-vis)), P_((p-IR)) and pointing errors, or directional errors, between the optical systems of the thermography arrangement 10 may be used to estimate a relation, e.g. equations or curves, for the displacement as a function of the distance to the observed real world scene. This equation or curve may be stored in a memory in the thermography arrangement to, for example the memory storage 15, and can be used to compensate for parallax errors during operation through mapping of a determined distance to the relevant parallax distance equation or curve.

As previously mentioned, the projected predetermined visible light symbol or pattern usually consists of more than one pixel, typically a number of pixels. Thereby, the symbol or pattern is more reliably determined than if only one pixel/one point was used for determining the distance. Furthermore, since the symbol or pattern has a shape or distribution that is easily distinguishable from anything that may appear in an image of an observed scene and may have the shape of an object known to man or any other suitable shape or distribution that renders it easily recognizable by a data processor, whereas a single pixel may be confused with other objects or noise present in the image.

Alignment

As explained above, the parallax distance in meters P_((p-vis)) causes the pixel displacement d_((pix vis)) between a visual image projected by the visible light projecting system 22 and an image captured by the visible light imaging system 14 and the parallax distance P_((p-IR)) causes the pixel displacement d_((pix IR)) between a visual image projected by the visible light projecting system 22 and an IR image captured by the IR imaging system 18. As is readily apparent to a person skilled in the art, there is typically also a parallax distance between the visible light imaging system 14 and the IR imaging system 18, causing a third pixel displacement between images captured by the different optical systems. This parallax distance and pixel displacement are not shown in FIG. 2.

According to an embodiment, the processor 13 is arranged to perform alignment of images captured by and/or light projected by any or all of the optical systems 14, 18, 22.

In order to be able to align the visible light projected onto the observed scene, using the visible light projecting system 22, with the IR radiation emitted from the observed scene, detected and transformed into an IR image by the IR imaging system 18, the displacement between the projected visible light and the detected IR radiation must be calculated, or approximated, and compensated for. According to different embodiments presented below, calculation or approximation of this displacement is performed either in calibration/alignment during production, self-calibration/alignment or self-adjustment/alignment during operation of a thermography arrangement 10.

Calibration/Alignment During Production

According to the embodiment illustrated in FIG. 1A, the visible light imaging system 14, the IR imaging system 18 and the visible light projecting system 22 are all assembled in an integrated thermography arrangement 10, for example integrated in an assembly 12, with known parallax distances between the different optical devices 14, 18, 22, optical axes OA1, OA3, OA2, respectively.

According to this embodiment, the thermography arrangement may be calibrated/aligned in production or manufacturing of the thermography arrangement 10. During such a calibration/alignment, all parallax distances are known since the distances between the optical axes OA1, OA3, OA2 are known. Other parameters that are known when calibration is performed during production are: the field of view of the visible light imaging system 14 (FOV_(vis)); the field of view of the IR imaging system 18 (FOV_(IR)); distance z to the observed scene; and the translation, or mapping function, ƒ(z) between image coordinates of an image captured using the visible light imaging system 14 and an image captured using the IR imaging system 18, as a function of z.

According to embodiments, the distance z is determined relative to a predetermined coordinate in the image, such as the center of the image, a corner of the image or any other suitable coordinate in the image.

Embodiments of production calibration methods comprise the following steps, illustrated in FIG. 4A:

Step 410:

Projecting a visible light pattern onto the observed real world scene, using the visible light projecting system 22, according to a second field of view at least partially overlapping the first field of view of the IR imaging system.

According to embodiments, the visible light projected may be in the form of an identifiable feature such as a pattern or symbol.

Step 420: Capture a visible light image of the observed real world scene, comprising the projected visible light pattern, using the visible light imaging system 14, according to a third field of view, the third field of view at least partially overlapping the first and/or second field of view.

According to an embodiment, two visible light images are captured, wherein one comprises the scene and the projected visible light while the other comprises the scene without the projected visible light. In other words, the projecting device projects visible light onto the scene during the time when one of the images is captured, but not while the other image is captured. By subtracting the captured images, a difference image comprising the projected visible light, but not the observed scene, is obtained.

Step 430: Detect the projected visible light pattern in the visible light image, or in the difference image if such an image has been obtained in Step 420.

According to an embodiment, there is a known predetermined relationship between the distance z to the observed scene and the location in a captured visible light image wherein a projected visible light will appear. Therefore, the distance z may in an optional Step 485 be used as input to the detection of the projected visible light. Thereby, a more efficient detection is obtained as the detection starts in the most probable location, or coordinates, of the visible light image.

Step 440: Calculate the pixel displacement d_((pix vis)) between the light projected by visible light projecting system 22 and the image captured by the visible light imaging system 14, based on the captured visible light image. In other words, determine the displacement in pixels, d_((pix vis)) in the visible light image, between the projected visible light pattern pixel coordinates and pixel coordinates in the visible light image where the projected visible light would appear if the visible light imaging system 14 and the visible light projecting system 22 were aligned, for instance known from production calibration/alignment or self-calibration/alignment. An example of a pixel displacement d_((pix vis)), is shown in FIG. 2.

As is readily apparent to a person skilled in the art, the pixel displacement may for example be expressed as divided into an x direction component and a y direction component (dx_((pix vis)),dy_((pix vis))) or expressed as polar coordinates, depending on circumstances.

Step 450: Calculate the FOV of the projector, FOV_(prof), if it not already known.

Since the FOV of the visible light imaging system, FOV_(vis), is known, FOV_(proj) may be calculated based on the captured visible light image, or difference image, comprising the projected visible light, that may be represented as an area, an identifiable feature, a pattern or a symbol, in the following way:

According to an embodiment, it is known what percentage of the FOV_(proj) that is represented by the distance between two or more predetermined points in the projected area, feature, pattern or symbol, for example in the x or y direction. In the captured visible light image, comprising the projected visible light area, feature, pattern or symbol, the pixel distance between predetermined points of the projected visible light area, feature, pattern or symbol is determined Since the resolution, in pixels, of the visible light image is known, the percentage of the visible light image, and thereby the percentage of FOV_(vis) that is represented by the distance between the two point of the projected visible light area, feature, pattern or symbol may be determined based on said pixel distance. Knowing FOV_(vis) and further knowing the relationship between the percentage of the FOV_(vis) and the FOV_(proj), respectively, that represents the distance between the predetermined points of the projected visible light area, feature, pattern or symbol, FOV_(proj) may be determined.

Step 460: Determine calibration parameters in the form of the calibration parameters c_(o) and c₁.

The calibration parameter c_(o) is a theoretical constant relating to the parallax distance between the optical axes of the two optical systems compared, for example the optical axes OA1, OA2. According to an embodiment, c_(o) is expressed in (length unit×number of pixels).

The calibration parameter c₁ relates to the pointing, or directional, error. In other words, c₁ relates to the angle between the optical axes of the two optical systems compared, for example the optical axes OA1, OA2. According to an embodiment, c1 is expressed in pixels.

According to an embodiment, the calibration parameters are determined in the following way:

$\begin{matrix} \left\{ \begin{matrix} {c_{0} = {f\left( {{FOV}_{vis},P_{({p\text{-}{vis}})}} \right)}} \\ {c_{1} = {d_{({pixvis})} - \frac{c_{0}}{z}}} \end{matrix} \right. & \left( {{Eq}.\mspace{14mu} 1} \right) \end{matrix}$ wherein the distance z to the observed real world scene, expressed in length units, is known and d_((pix vis)) is the pixel displacement, expressed in pixels, as calculated in Step 440.

As is readily apparent to a person skilled in the art, the calibration parameters may for example be expressed as divided into an x direction component and a y direction component (c_(ox), c_(oy)), (c_(ox), c_(oy)) or expressed as polar coordinates, depending on circumstances.

Step 490: Calibrate the optical systems of the thermography arrangements, or in other words compensate for parallax error, or pixel displacement and pointing error, determined in step 460.

After the calibration in Step 490, a projection produced by the projecting system 22 will be aligned with the IR radiation captured by the IR imaging system 18. In other words, after Step 490, the thermography arrangement is ready to operate, and may further, according to embodiments, be used as a distance sensor during operation.

According to an embodiment, the calibration process described above is performed more than once, for example two or three times, in order to ensure proper calibration.

Embodiments of the operation of a calibrated or aligned thermography arrangement is illustrated in FIG. 8.

Self-Calibration

According to another embodiment, the thermography arrangement is adapted for self-calibration/alignment, the parallax distances between the visible light projecting system 22 on the one hand and visible light imaging system 14 and IR imaging system 18, respectively, on the other hand may be approximated.

According to this embodiment, shown in FIG. 1B and further described in the section Detachably attachable components embodiment, an attachment feature 25A is provided on the projecting system 22 and is adapted to fit to a corresponding attachment feature 25B provided on the IR imaging system 10 so that the projecting system 22 can be attached to and detached from the IR imaging system 10. Such an attachment feature can for example be formed as an attachment coupling with a first coupling part 25A fixed to the projecting system and a second coupling part 25B fixed to the IR imaging system. When attached, the visible light projecting system 22 is according to an embodiment positioned with a certain parallax distance and pointing error compared to the IR imaging system 18 and the visible light imaging system 14 respectively, substantially the same each time the attachment features are attached to each other, with a minor margin of error.

According to an embodiment, the thermography arrangement is self-calibrating/aligned. During such a self-calibration, the following parameters are known from calibration/alignment during calibration in production of the thermography arrangement: the parallax distance and pointing error between the visible light imaging system 14 and the IR imaging system 18; the field of view of the visible light imaging system 14 (FOV_(vi s)); the field of view of the IR imaging system 18 (FOV_(IR)); and the translation, or mapping function, ƒ(z) between image coordinates of an image captured using the visible light imaging system 14 and an image captured using the IR imaging system 18, as a function of the distance z to the observed scene. According to embodiments, the aim of the self-calibration is to estimate the parallax distance calibration parameter, the pointing error calibration parameter and, if it is not already known, the field of view of the projecting system 22 (FOV_(proj))

Embodiments of methods for self-calibration comprise the following steps, illustrated in FIG. 4B:

Steps 410, 420, 440, 450, 460 and 490 correspond to the same steps presented above, relating to FIG. 4A.

Step 430 corresponds to step 430 described above, except for the optional step 485 of inputting the distance z, since the distance z is not previously known or predetermined. Instead, the distance z is determined by being measured in Step 470, for example by means of a distance sensor or a time-of-flight sensor. According to an embodiment, the distance z is input or fed back to the detection the projected visible light area, feature, pattern or symbol of Step 430 in step 480, thereby providing a more intelligent or efficient area, feature, pattern or symbol detection as described above for Step 430.

According to an embodiment, the calibration process described above is performed more than once, for example two or three times, in order to ensure proper calibration.

Embodiments of the operation of a calibrated or aligned thermography arrangement is illustrated in FIG. 8.

Operation of Calibrated Thermography Arrangement

Once a thermography arrangement has been calibrated/aligned according to any of the embodiments presented above, relating to FIGS. 4A and 4B, the arrangement is ready for operation. In operation, the thermography arrangement will work in the same way, regardless of whether the calibration has been performed in production or during use, as illustrated in FIG. 7.

A thermography arrangement that has been calibrated/aligned in production, as well as a self-calibrating/aligning thermography arrangement, is calibrated or aligned after Step 490 according to embodiments of the method embodiments presented above. After the calibration/alignment in Step 490, a projection produced by the projecting system 22 will be aligned with the IR radiation captured by the IR imaging system 18. In other words, after Step 490, the thermography arrangement is ready to operate, and may further, according to embodiments, be used to determine the distance to an observed scene, i.e. to perform the function of a distance sensor, during operation. According to an embodiment, the thermography arrangement may be used to determine the distance to an observed scene using the following relationship:

$\begin{matrix} {z = \frac{C_{0}}{d_{({{pix}\;{vis}})} - C_{1}}} & \left( {{Eq}.\mspace{14mu} 2} \right) \end{matrix}$ wherein the parameters corresponds to the parameters of Eq. 1 above.

As is readily apparent to a person skilled in the art, all of the parameters of Eq. 2 may for example be expressed as divided into an x direction component and a y direction component, or expressed as polar coordinates, depending on circumstances.

As is readily apparent to a person skilled in the art, the relationship in Eq. 2 may alternatively be used to determine any of the parameters c_(o), c₁, z or d_((pix vis)) if the remaining parameters of the equation are known.

In operation, according to embodiments shown in FIG. 8, a calibrated/aligned thermography arrangement produces a visible light projection onto an observed scene, in alignment with IR radiation emitted from the observed scene and received by an IR sensor of an IR imaging system of the thermography arrangement, by obtaining or retrieving the distance z to the observed object, objects or scene; determine the pixel displacement d_(pix vis) based on the distance z and calibration parameters C_(o) and C₁ determined in production or during self-calibration, as described above, and method embodiments comprising the following steps:

Step 810: Detecting IR radiation emitted from the observed real world scene, using an IR imaging system 18, according to a first field of view and creating a visible representation of the detected IR radiation, in the form of an IR image. Typically, the detected IR radiation reaches an IR sensor array goof the IR imaging system 18, having a certain first field of view.

Step 820: Retrieve the distance z from the thermography arrangement 10 to the observed real world scene or object.

According to embodiments, the distance z may be for instance be retrieved by calculation using relationships with known parameter and/or parameters that the thermography arrangement is enabled to retrieve, for instance the relationship of Eq. 2 presented above. According to alternative embodiments, the distance z may be retrieved by use of a distance sensor integrated in or coupled to the thermography arrangement. In one example the distance is retrieved by use of double visible light sensors, detection of a laser spot in an IR image, the position of the focus lens or by use of a distance sensor integrated in or coupled to the thermography arrangement in per se known manners.

According to an embodiment, the retrieved distance z is used as input to Step 830.

Step 830: Calculate the pixel displacement d_(pix IR) between a visual image projected by the visible light projecting system 22, according to a first field of view, and an IR image, as a visible representation of infrared (IR) radiation emitted from said observed real world scene detected according to a first field of view, captured by the IR imaging system 18.

According to embodiments, the relationship between the pixel displacement d_(pix IR) and the pixel displacement d_(pix vis), between a visual image projected by the visible light projecting system 22 and a visible light image captured by the visible light imaging system 14, as a function of the distance to the observed object, objects or scene, is known from production or calibration. One way of describing the relationship is: d _(pix IR)=ƒ(d _(pix vis,z))  (Eq. 3)

According to an embodiment, the relationship is a mapping function, for instance expressed as a lookup table, wherein every value for d_(pix vis) has a corresponding value for d_(pix IR), based on the value of the retrieved distance z. For simplicity, each displacement is here formulated as one value d_(pix vis) or d_(pix IR). However, the displacements may comprise more than one component. Typically for an image a displacement is described in terms of an x component and a y component, for instance in the form of a vector (e.g. dx_(pix vis), dy_(pix vis)), or as polar coordinates.

According to embodiments described above the distance z is known from Step 820. Therefore, in order to determine d_(pix IR) we first need to know d_(pix vis). If the displacement d_(pix vis) is not already known, it may as described above be determined using the known parameters C_(o) and C₁ and the relationship presented in Eq. 2.

When d_(pix vis) is known or determined, the pixel displacement d_(pix IR) is determined by using the relationship of Eq. 3 according to any of the embodiments presented above.

Step 840: Present the IR image onto the observed scene in alignment with the observed scene. In other words, presenting the IR image onto the observed scene in alignment with IR radiation emitted from the observed scene.

Aligning IR Image

According to an embodiment, the IR image is aligned to the observed scene, or in other words aligned to the IR radiation emitted from the observed scene, by compensating for the pixel displacement d_(pix IR) determined in Step 830. The alignment, or compensation, may be performed in the processor 13 of the thermography arrangement 10, or in another processor integrated in or coupled to any of the components of the thermography arrangement 10.

According to an embodiment, presenting the aligned IR image onto the observed scene comprises transferring an aligned IR image to the visible light projecting system 22 and projecting the aligned IR image onto the observed scene using the visible light projecting system 22.

According to an alternative embodiment, presenting the aligned IR image onto the observed scene comprises transferring an IR image to the visible light projecting system 22, aligning the IR image using a processor integrated in or coupled to the visible light projecting system 22, and projecting the aligned IR image onto the observed scene using the visible light projecting system 22.

According to an embodiment, FOV_(proj) is smaller than FOV_(IR). According to this embodiment, the visible light projecting system 22 will not be adapted to display the entire IR image. Therefore, a part of the IR image that corresponds to the FOV_(proj) is obtained, for example by selecting, cropping or cutting out said part from the IR image, and then projected onto the observed real world scene.

According to an embodiment, the IR image is aligned to the observed scene, or in other words aligned to the IR radiation emitted from the observed scene, by compensating for the pixel displacement d_(pix IR) determined in Step 830. The alignment, or compensation, may be performed in the processor 13 of the thermography arrangement 10, or in another processor integrated in or coupled to any of the components of the thermography arrangement 10.

According to an embodiment, presenting the aligned IR image onto the observed scene comprises transferring an aligned IR image to the visible light projecting system 22 and projecting the aligned IR image onto the observed scene using the visible light projecting system 22.

According to an alternative embodiment, presenting the aligned IR image onto the observed scene comprises transferring an IR image to the visible light projecting system 22, aligning the IR image using a processor integrated in or coupled to the visible light projecting system 22, and projecting the aligned IR image onto the observed scene using the visible light projecting system 22.

In one embodiment the visible light projecting system 22 FOV is completely comprised in the FOV of the IR imaging system 18, According to this embodiment, aligning the IR image to the detected infrared (IR) radiation emitted from said observed real world scene comprises obtaining the part of the IR image that corresponds to the FOV_(proj), based on the pixel displacement d_(pix IR) and FOV_(proj), for example by selecting, cropping or cutting out said part from the IR image.

According to one embodiment the visible light projecting system 22 FOV only partly overlaps with the FOV or the IR imaging system 18, According to this embodiment, aligning the IR image to the detected infrared (IR) radiation emitted from said observed real world scene comprises obtaining the part of the IR image that that lie within the overlapping part of the FOVs of the two systems.

According to one embodiment aligning the IR image to the detected infrared (IR) radiation emitted from said observed real world scene further comprises obtaining parts of the IR image where the corresponding detected infrared (IR) radiation emitted from said observed real world scene is fulfilling a condition, e.g. is above a threshold, below a threshold or within an interval

According to one embodiment aligning the IR image to the detected infrared (IR) radiation emitted from said observed real world scene further comprises obtaining parts of the IR image is based on areas indicated by the thermography arrangement 10 operator, using input features of the IR imaging system 10, or based on object detection features implemented in the processor 13, detecting parts of the IR image as objects.

According to an embodiment, illustrated in FIG. 2, the visible light imaging system 14 has the largest FOV, the IR imaging system 18 has the second largest FOV and the projecting system 22 has the smallest FOV. However, any other relationship in FOV sizes is conceivable, depending on circumstances such as price, performance and end customer requirements.

Self-Adjustment

According to another embodiment, the thermography arrangement is self-adjusting or self-aligning, or in other words adjusts or aligns itself during operation.

In operation, according to embodiments the thermography arrangement produces a visible light projection onto an observed scene, in alignment with IR radiation emitted from the observed scene, by: receiving IR radiation emitted from an observed scene using an IR sensor of an IR imaging system of the thermography arrangement; converting the received IR radiation into a visible representation in the form of an IR image; obtaining or retrieving the distance z from the thermography arrangement to the observed object, objects or scene; determining the pixel displacement d_(pix vis); converting pixel displacement d_(pix vis) to pixel displacement d_(pix IR); aligning the IR image by compensating for the pixel displacement d_(pix IR); and projecting the aligned IR image onto the observed scene, thereby obtaining presentation of an IR image onto a scene, in alignment with the IR radiation emitted from the scene.

According to embodiments, the parallax distances and pointing error between the visible light projecting system 22 on the one hand and visible light imaging system 14 and IR imaging system 18, respectively, on the other hand are not known, since the visible light projecting system 22 is a component that is physically separated from the other optical systems 14, 18, at an unknown and non-constant distance from the optical systems 14, 18. This embodiment is shown in FIG. 1C and further described above, in the section Separate components embodiment.

During such a self-adjustment, self-alignment, or alignment during operation, the following parameters are known from production: the parallax distance and pointing error between the visible light imaging system 14 and the IR imaging system 18; the field of view of the visible light imaging system 14 (FOV_(vis)); the field of view of the IR imaging system 18 (FOV_(IR)); and the translation, or mapping function, ƒ(z) between image coordinates of an image captured using the visible light imaging system 14 and an image captured using the IR imaging system 18, as a function of the distance z to the observed scene. According to embodiments, the aim of the self-alignment is to estimate the parallax distance, pointing error and the field of view of the projecting system 22 (FOV_(proj)), in order to enable alignment of the different optical systems of the thermography arrangement.

Referring to FIG. 4B, embodiments of methods are illustrated. Steps 410, 420, 430, 440, 450, 470 and 480 correspond to the same steps presented above, relating to FIG. 4B. Embodiments of self-adjustment further comprise the following steps, illustrated in FIG. 6:

Step 610: Convert the calculated pixel displacement in the x and y direction (dx_((pix vis)),dy_((pix vis))), between the light projected by visible light projecting system 22 and the image captured by the visible light imaging system 14, to pixel displacement in the x and y direction (dx_((pix IR)),dy_((pix IR))), between the light projected by visible light projecting system 22 and an image captured by the IR imaging system 18, using the translation, or mapping function, shown in Eq. 3 above, between image coordinates of an image captured using the visible light imaging system 14 and an image captured using the IR imaging system 18, known from production.

Step 620: Present, or project, visible light in alignment with IR radiation received from the observed scene.

According to an embodiment, Step 620 comprises transferring the IR image in the form of an IR image signal, from the processor 13 to the visible light projecting system 22, whereby the projector 29 of the visible light projecting system 22 projects the resampled IR image data onto the real world scene. The IR image data is thereby projected in alignment with the real world scene, in other words the IR image data is projected in the direction from which the corresponding detected IR radiation information was emitted.

In contrast to a thermography arrangement that has been calibrated/aligned in production or self-calibrated during operation, the self-alignment described above does not result in calibration of the thermography arrangement. Instead, the self-alignment, or self-adjustment, is performed continuously during operation, through the conversion or mapping of Step 610.

According to an embodiment, the calibration process described above is performed more than once, for example two or three times, in order to ensure proper adjustment.

Presentation/Projection Embodiments

In FIG. 5, method embodiments for presenting a visible representation of infrared (IR) radiation information onto an observed real world scene based on infrared (IR) radiation emitted from said real world scene, using an infrared (IR) thermography arrangement 10 comprising an infrared (IR) imaging system 18, a visible light imaging system 14 and a visible light projecting system 22, wherein the visible representation of infrared (IR) radiation information is presented in alignment with said infrared (IR) radiation emitted from said observed real world scene is shown.

According to FIG. 5 presentation, or projection, method embodiments comprise the following steps:

Step 502: Detecting IR radiation emitted from the observed real world scene, using an IR imaging system 18, according to a first field of view. Typically, the detected IR radiation reaches an IR sensor array 20 of the IR imaging system 18, having a certain first field of view.

Step 504: Creating a visible representation of the detected IR radiation, in the form of an IR image.

Step 506: Projecting a visible light pattern onto the observed real world scene, using the visible light projecting system 22, according to a second field of view at least partially overlapping the first field of view of the IR imaging system.

Typically, the visible light is projected onto the real world scene via a visible light projecting system 22 having a certain second field of view. The two optical systems 18, 22 are arranged in relation to each other such that the first and second fields of view at least partially overlap. In other terms, the optical systems 18, 22 are positioned with a mutual parallax or relative distance.

The projected visible light pattern may make up a symbol or any other identifiable feature when projected may comprise at least one and preferably a low number of pixels, such as 2-15 pixels, or it may comprise a larger number of pixels. According to embodiments, the projected visible light may be in the form of an area, an identifiable feature, a pattern or a symbol.

Step 508: Capturing a visible light image of the observed real world scene, comprising the projected visible light, using the visible light imaging system 14, according to a third field of view, the third field of view at least partially overlapping the first and/or second field of view.

Step 510: Detecting in the captured visible light image the projected visible light pattern.

According to embodiments, the projected visible light may be in the form of an area, an identifiable feature, a pattern or a symbol.

In an optional Step 512, a distance z from the thermography arrangement 10 to the observed scene is retrieved.

According to an embodiment, the distance z is dependent on a predetermined displacement between the visible light imaging system and the visible light projector. According to an embodiment, the distance to each point on the observed real world scene that is illuminated by the detected visible light symbol or pattern is retrieved. According to an embodiment, the retrieved distances are used to form a distance map.

According to different embodiments, the distance or distances may be previously known, determined by use of a distance sensor integrated in or coupled to the thermography arrangement, determined by use of the thermography arrangement as a distance sensor, by calculation using relationships with known parameter and/or parameters that the thermography arrangement is enabled to retrieve, for instance the relationship of Eq. 2 presented above. According to alternative embodiments, the distance z may be retrieved by use of double visible light sensors, detection of a laser spot in an IR image, the position of the focus lens or by use of a distance sensor integrated in or coupled to the thermography arrangement in per se known manners.

Step 514: Determine the pixel displacement d_((pix vis)), between the detected visible light pattern and the visible light image.

According to an embodiment, this may be described as determining the distance in the captured visual light image between one or more selected coordinates of the detected visible light pattern, e.g. area, feature, or symbol in the image projected by the visible light projecting system 22 and captured by the visible light imaging system 14, and the coordinates in the visible light image where the projected visible light would appear if the visible light imaging system and the visible light projecting system were aligned.

In one non-limiting example the coordinates where the projected visible light would appear if the visible light imaging system and the visible light projecting system were aligned, is a predetermined coordinate in the image, such as the center of the image, a corner of the image or any other suitable coordinate in the visible light image.

According to embodiments wherein the distance z has been retrieved in the optional Step 512, the pixel displacement d_((pix vis)) between the detected projected visible light and the visible light image is determined based on the retrieved distance z.

Step 514 further comprises determining the pixel displacement d_((pix IR)) between the IR image and the visible light image, based on the pixel displacement d_((pix vis)) between the detected projected visible light and the visible light image.

According to embodiments wherein the distance z has been retrieved in the optional Step 512, the pixel displacement d_((pix IR)) between the IR image and the visible light image is determined based on the pixel displacement d_((pix vis)) and the retrieved distance z.

According to an embodiment, the pixel displacement d_((pix IR)) is determined using the relationship presented in connection with Eq. 3 above.

Step 516: Align the visible light representation of the detected IR radiation information, in other words the IR image, to the detected IR radiation information emitted from the observed real world scene, based on said pixel displacement d_((pix IR)).

According to an embodiment, the visible representation of the detected IR information is represented in the form of an IR image, and the alignment is performed by adjusting the IR image information in accordance with the pixel displacement information determined in step 514.

Step 518: Presenting the aligned visible representation of the detected IR radiation information by projecting the aligned visible representation, e.g. in the form of an IR image, onto the observed real world scene, in alignment with the detected IR radiation emitted from the scene, using the visible light projecting system 22.

According to an embodiment, Step 518 comprises transferring the IR image in the form of an IR image signal, from the processor 13 to the visible light projecting system 22, whereby the projector 29 of the visible light projecting system 22 projects the resampled IR image data onto the real world scene. The IR image data is thereby projected in alignment with the real world scene, in other words the IR image data is projected in the direction from which the corresponding detected IR radiation information was emitted.

According to an embodiment, Steps 502 to 518, according to any of the embodiments described herein, may be performed more than once. According to an embodiment Steps 502 to 518 may be performed a suitable number of times order to ensure proper alignment free from measurement related errors. According to an embodiment Steps 502 to 518 may be performed repeatedly during projection, for example according to a predetermined rate, wherein the rate may be dependent on the frame rate of the one of the optical systems 14, 18 or 22.

Projection onto a Non-Flat Surface

In FIG. 2, the real world scene is illustrated as a flat surface 200. However, the object, objects or scene that a user of the IR imaging system 10 is analyzing will rarely consist of a flat surface that is perfectly orthogonal to the optical axis of the visual light projector 22.

In FIG. 3A, an optical system of the IR imaging system used on a surface that is not orthogonal to the optical axis of the visual light projector 22 is shown. The surface in FIG. 3A is inclined in one dimension in relation to the optical axis of the visual light projecting system 22. However, the surface may just as well be inclined in two dimensions relation to the optical axis of the visual light projecting system 22. In use of the IR imaging system 10, this would relate for example to an operator using the device 10 to project a visible representation of detected IR radiation information onto a heated floor that is being investigated. Since the operator is standing on the floor, this makes it difficult for him or her to hold the device 10 such that the optical axis of the projecting system 22 is orthogonal to the floor.

This exemplary embodiment is further illustrated in FIG. 3C, where the optical axis OA of the projecting system 22 (not shown in the figure) falls obliquely onto an investigated surface, in this case a floor 310, in such a direction that it is inclined in two dimensions, by way of example the x- and z-directions of the coordinate system 330.

An example of a non-flat surface 310 is shown in FIG. 3B, for which different embodiments of the present invention can also advantageously be used, according to the method described further below, especially for embodiments of the invention where several distances from the thermography arrangement 10 to more than one point in the observed scene are retrieved as described below. The non-flat surface 310 of FIG. 3B is one example of what such a surface might look like. Since the surface is a the surface of a real world object, any 3D shape is possible, comprising any combination of flat surface parts, curved parts and/or embossed parts.

In FIGS. 3A and 3B, an optical system 300 with an optical axis OA and a FOV with the angle v is shown. Only one optical system is shown in FIGS. 3A and 3B, instead of all three optical systems as shown in FIG. 2. This is merely for the sake of simplicity of the drawing. In the explanations below, the optical system 300 may alternately represent the visible light imaging optical system 14, the IR imaging system 18 or the visible light projector 22.

Distance Mapping

As described above in Step 512, in connection with FIG. 5, more than one distance value, i.e. a plurality of distance values from the thermography arrangement 10 to more than one point in the observed scene may be retrieved or calculated and turned into a distance map, wherein each value in the distance map corresponds to a retrieved distance values from the thermography arrangement 10 to a point in the observed scene. The distance map may also be referred to as distance image.

According to an embodiment, a distance map enables projection of the IR image onto the observed real world scene to be aligned with the object or objects comprised in the observed real world scene at different distances or depths from the thermography arrangement 10, since each projected pixel of the aligned IR image may be adapted to be projected, dependent on the distance map.

According to an exemplary embodiment, the IR image is projected as a visible light pattern onto the observed real world scene in alignment with the object or objects comprised in the observed real world scene at different distances from the thermography arrangement 10, by adapting each projected pixel of the aligned IR image with varying density, dependent on the distance map and preset conditions. For example, the thermography arrangement maybe adapted to project pixels more sparsely if the retrieved distances in the distance map, z_(i) from the thermography arrangement 10 to the points i on the object, objects or scene onto which the pixels are to be projected, exceeds a preset threshold. In this way, a more detailed projection is provided for projected parts of the scene that are close to the thermography arrangement 10. Alternatively, the thermography arrangement 10 may instead be adapted to project pixels more closely if the distances z_(i) exceed a preset threshold, thereby providing a more detailed projection for projected parts of the scene that are far from the thermography arrangement 10. According to a third exemplary embodiment, the thermography arrangement 10 may be adapted to project pixels more sparsely or closely when the distances z_(i) are within certain intervals. There may be one or more intervals and/or thresholds. The intervals and/or thresholds may be predefined and stored in the memory 15 thermography arrangement 10 or selected and input by an operator of the thermography arrangement 10, using input features comprised in the one or more control devices 19 communicatively coupled with the interface medium 21 of the IR imaging system 10.

In order to achieve the projection adaptations described above, image processing features of the processor 13 may according to embodiments resample the IR image data, dependent on the predefined or operator input interval, intervals, threshold, threshold or other values describing the distribution of the pixels to be projected. After aligning, e.g. resampling, of the IR image data has been performed, the resampled IR image is transferred, in the form of an IR image signal, from the processor to the visible light projecting system 22. The projector 29 of the visible light projecting system 22 projects the resampled IR image data onto the real world scene. The IR image data is thereby projected in alignment with the real world scene, in other words the IR image data is projected in the direction from which the corresponding detected IR radiation information was emitted.

According to an exemplary embodiment, the IR image is projected as a visible light pattern onto the observed real world scene in alignment with the object or objects comprised in the observed real world scene at different distances from the thermography arrangement in, by adapting each projected pixel of the aligned IR image with varying size, dependent on the distance map. The projector 29 is enabled to project larger pixels onto points in the real world scene that are found to be at a greater retrieved distance, represented by the distance map, from the thermography arrangement 10, i.e. a greater distance from the operator, and smaller or regular sized pixels when the retrieved distance, represented by the distance map, is smaller. According to another embodiment, the projector is further adapted to increase/decrease the size of the pixels projected as a function of the detected distances to the real world scene, e.g. having a linear dependency.

In this way, pixels will appear more similar in size to the operator of the thermography arrangement 10 when projected at objects in the observed real world scene located at different distances from the thermography arrangement 10. In particular, through the adapted frequency (sparse or close) and/or amplitude (small or large) of the pixels to be projected, aligned projection onto surfaces that are non-flat and/or not orthogonal to the optical axis of the visible light projector is enabled. For example, if an operator aims the IR imaging system 10 at a heated floor on which the operator is standing or at a wall of a building in front of the operator, it is likely that the surface will not be orthogonal to the optical axis of the visible light projecting system 22.

As stated above, according to different exemplary embodiments, the projector 22 may comprise a laser projector, a liquid crystal display (LCD), a digital light processing (DLP) projector or any other suitable type of projector known in the art.

The use of a laser projector may according to some embodiments be an advantageous choice, since laser projectors have a high Depth of Field, which renders good projection results onto non-flat surfaces.

Different equivalent terms for the projector used in this text include visible light projector, visible light pattern projector, visible image/imaging projector, from which terms the purpose and function of the projector should be readily understood.

Detection/Capturing of Projected Visible Light Pattern

As mentioned above, the visible light projector 22 projects visible light pattern, that may be in the form of an area or a predetermined identifiable feature, for example in the form of a symbol or pattern, which is detected in an image captured by the visible light imaging system 14. The projection may include all or part of the pixels comprised in the FOVproj, and may have a human or computer recognizable form or not. For simplicity, the projected visible light that is to be detected is described as a pattern or a symbol below.

Detection of a symbol or pattern in an image may be performed using any suitable detection method, per se known in the art, for example feature extraction, template matching, segmentation, edge detection, thinning, similarity measures, masking, intensity thresholding or filtering.

According to a non-computationally expensive exemplary embodiment, a first and a second image of a real world scene are captured in close succession using the visible light imaging system 14 while the visible light projecting system 22 “flashes” a predetermined identifiable feature, for example in the form of a symbol or pattern, during a short period of time. For instance, before the second image is captured, the predetermined symbol or pattern is projected onto the real world scene using the visible light projector 22, the FOV of the visible light imaging system 14 at least partially overlapping with the FOV of the visible light projector 22. Thereby, the second image comprises substantially the same scene as the first image, but with the addition of the projected pattern. According to this embodiment, the processor 13 that controls the activation of the projecting system 22 synchronizes the projection with the capturing of images performed by the visible light imaging system 14.

This enables the visible light imaging system 14 to capture two subsequent frames, wherein one frame comprises at least part of the projected symbol or pattern superimposed onto the observed real world scene, while the other frame comprises the same view of the real world scene without the projection. By subtracting the first image from the second image a difference image is obtained, comprising the detected symbol or pattern. This exemplary pattern extraction method may for example be advantageous to use if the scene in itself contains much information, or “noise”.

Further Embodiments

In one embodiment the retrieved distance parameter z corresponds to the focusing distance if the visible light projector 22 is projecting visible light pattern onto a certain object that should be in focus. Therefore, this information can be used for exact focusing of the thermography arrangement 10.

According to an exemplary embodiment, the visual light image projector 22 is a laser projection device. Laser projection devices are focus free, meaning that the focus lens has a focal point that is fixed at its hyper focal distance. Rather than having a method of determining the correct focusing distance and setting the lens to that focal point, a focus free lens relies on depth of field to produce acceptably sharp images. Therefore, no focusing of the laser projection device is needed. According to other exemplary embodiments, any other appropriate type of projection device may be used, according to circumstances.

According to an embodiment there is provided a computer system having a processor being adapted to perform any of the steps or functions of the embodiments presented above.

According to an embodiment of the invention, there is provided a computer-readable medium on which is stored non-transitory information for performing a method according to any of the embodiments presented above.

According to further embodiments, there is provided computer-readable mediums on which is stored non-transitory information for performing any of the method embodiments described above.

According to an embodiment, the user can capture a visible light image of the observed scene while projecting visible light onto the scene, in alignment with IR radiation emitted from the observed scene, and save the captured image for later viewing or for transfer to another processing unit, such as a computer, for further analysis and storage.

In alternative embodiments, disclosed alignment methods can be implemented by a computing device such as a PC, communicatively coupled to the thermography arrangement, and/or an FPGA-unit specially adapted for performing the steps of the method of the present invention, and/or encompass a general processing unit 2 according to the description in connection with FIG. 2. The computing device may further comprise the memory 15 and/or the display unit 3.

Further Advantages

According to embodiments of the invention described herein, the projection of visible light onto a observed real world scene is performed in real time or near real time (live) on site, or in other words live, thereby enabling a user easier interpretation and analysis of an observed real world scene since the user is presented with relevant information directly onto the observed real world scene. As the visible light information, comprising a visible representation of IR radiation received from the observed real world scene, is projected onto said observed real world scene in real time or in near real time (live), the user does not have to look away from the observed real world scene in order to relate received IR radiation information with what he or she sees in the observed real world scene. Furthermore, according to embodiments of the present invention the visible light is projected onto the observed real world scene in alignment with the observed real world scene, or in other words in alignment with the IR radiation emitted from the observed real world scene, thereby further aiding the user in relating the projected visible light information with the observed real world scene and further facilitating interpretation and analysis of the observed/investigated observed real world scene. 

What is claimed is:
 1. A method of presenting a visible representation of infrared (IR) radiation information onto an observed real world scene based on IR radiation emitted from said observed real world scene, using a thermography arrangement comprising an IR imaging system, a visible light imaging system, and a visible light projecting system, the method comprising: capturing IR radiation information based on detected IR radiation emitted from said observed real world scene according to a first field of view of said IR imaging system; creating a visible representation of said detected IR radiation in the form of an IR image; projecting a visible light pattern onto said observed real world scene according to a second field of view of said visible light projecting system, said second field of view at least partially overlapping said first field of view; capturing a visible light image of said observed real world scene, said scene comprising said projected visible light pattern, according to a third field of view of said visible light imaging system, said third field of view at least partially overlapping the first and/or the second field of view; detecting said projected visible light pattern in said captured visible light image; determining the pixel displacement d_((pix vis)), in pixel coordinates in the visible light image, between the pixel coordinates of said detected visible light pattern and calculated pixel coordinates of said projected visible light pattern where the projected light pattern would appear if the visible light imaging system and the visible light projecting system were aligned, dependent on a predetermined relation between said visible light imaging light imaging system and said visible light projecting system; determining the pixel displacement d_((pix IR)), in pixel coordinates in the IR image, between the IR image and the visible light image, based on said pixel displacement d_((pix vis)) between the detected projected visible light pattern and the visible light image, dependent on a predetermined relation between said IR imaging system and said visible light projecting system; aligning said IR image to the detected IR radiation emitted from said observed real world scene, based on said pixel displacement d_((pix IR)); and presenting said aligned IR image by projecting it onto said real world scene according to the second field of view in alignment with the detected IR radiation emitted from the observed real world scene.
 2. The method of claim 1, further comprising retrieving the distance z from the thermography arrangement to the observed scene, and determining the pixel displacement d_((pix vis)) between the detected projected visible light and the visible light image based on the retrieved distance z; and/or determining the pixel displacement d_((pix IR)) between the IR image and the visible light image, based on the pixel displacement d_((pix vis)) between the detected projected visible light and the visible light image and the retrieved distance z.
 3. The method of claim 1, further comprising: if the first field of view is equal to the third field of view, receiving in the visible light projector IR image pixel information of all pixels in the IR image; if the first field of view is smaller than the third field of view, receiving in the visible light projector IR image pixel information of the pixels in the IR image that correspond to the part of the scene that is comprised in the first field of view; or if the first field of view is larger than the third field of view, receiving in the visible light projector IR image pixel information of all pixels in the IR image and further rescaling the received information to the resolution of the visible light projection device.
 4. The method of claim 2, wherein the distance z is retrieved by using the thermography arrangement as a distance meter.
 5. The method of claim 2, wherein the distance z is retrieved by use of a distance sensor integrated in or coupled to the thermography arrangement.
 6. The method of claim 4, wherein the thermography arrangement is calibrated in production.
 7. The method of claim 1, wherein the thermography arrangement is self-calibrating during use.
 8. The method of claim 1, wherein the thermography arrangement is adapted to adjust itself during operation.
 9. The method of claim 2, wherein more than one distance is retrieved and said more than one distance are used to create a distance map or distance image.
 10. The method of claim 9, wherein the distances of said distance map, or distance image, are used to align the visual representation of the IR image with the observed real world at different depths dependent on the distance map.
 11. The method of claim 9, further comprising: projecting pixels with varying density, dependent on the distances of the distance map, or distance image, and preset conditions.
 12. The method of claim 9, wherein projection in alignment onto a non-flat surface or object, or a surface in said real world scene that is not orthogonal to the optical axis of said visible light projector, is enabled by retrieval of more than one distance z_(i).
 13. The method of claim 1, further comprising compensating for parallax distance and directional error.
 14. The method of claim 13, wherein said compensation is achieved through calibration of the visible light imaging system and the visible light image projection device during production or during use.
 15. The method of claim 1, further comprising detecting one or more objects in the scene, dependent on the thermal properties of the one or more objects.
 16. The method of claim 15, wherein each of the one or more detected objects has a temperature pattern that deviates from the surroundings in one of the following ways: the mean temperature of the detected object is lower than the mean temperature of its immediate surroundings; or the mean temperature of the detected object is higher than the mean temperature of its immediate surroundings.
 17. The method of claim 15, wherein only visible light representing the detected IR radiation of the one or more detected objects is projected onto the scene.
 18. A thermography arrangement for presenting a visible representation of infrared (IR) radiation information onto an observed real world scene based on IR radiation emitted from said real world scene, the arrangement comprising: an IR imaging system for detecting IR radiation emitted from said observed real world scene according to a first field of view; a processor adapted to capture IR radiation information based on detected IR radiation emitted from said observed real world scene according to a first field of view of said IR imaging system, thereby creating a visible representation of said detected IR radiation in the form of an IR image; a visible light projecting system adapted to project a visible light pattern and/or image onto said observed real world scene according to a second field of view, at least partially overlapping the first field of view; a visible light imaging system adapted to capture a visible light image of said observed real world scene, according to a third field of view, the third field of view at least partially overlapping the first and/or second field of view; said processor further being adapted to: project a visible light pattern onto said observed real world scene according to a second field of view of said visible light projecting system, said second field of view at least partially overlapping said first field of view, capture a visible light image of said observed real world scene, said scene comprising said projected visible light pattern, according to a third field of view of said visible light imaging system, said third field of view at least partially overlapping the first and/or the second field of view, detect said projected visible light pattern in said captured visible light image, determine the pixel displacement d_((pix vis)), in pixel coordinates in the visible light image, between the pixel coordinates of said detected visible light pattern and calculated pixel coordinates of said projected visible light pattern where the projected light pattern would appear if the visible light imaging system and the visible light projecting system were aligned, dependent on a predetermined relation between said visible light imaging light imaging system and said visible light projecting system, determine the pixel displacement d_((pix IR)), in pixel coordinates in the IR image, between the IR image and the visible light image, based on said pixel displacement d_((pix vis)) between the detected projected visible light pattern and the visible light image, dependent on a predetermined relation between said IR imaging system and said visible light projecting system, align said IR image to the detected IR radiation emitted from said observed real world scene, based on said pixel displacement d_((pix IR)), and present said aligned IR image by projecting it onto said real world scene according to the second field of view, in alignment with the detected IR radiation emitted from the observed real world scene.
 19. The thermography imaging arrangement of claim 18, wherein the processor is a Field-programmable gate array (FPGA) or another processing device configurable using a hardware description language (HDL).
 20. A computer-readable medium on which is stored non-transitory information adapted to control a processor to perform the method of claim
 1. 